PADUA FACILITIES
Scanning Electron Microscopy
The Microscopy Lab at ICMATE-CNR of Padova is equipped with a Field Emission Scanning Electron Microscope (FESEM) FEI Quanta 200FEG-ESEM. Supplied with a field emission gun, it is capable to operate both in high and low vacuum conditions.
Images are generated by using both Secondary Electrons (SE) and Back-Scattered Electrons (BSE).
SEM analysis provides detailed information on:
- Sample morphology at micro- and nanoscale
- Surface features, textures, and topography
- Material contrast through electron-material interactions
The instrument is also equipped for X-ray Spectrometry (EDS/EDX) for elemental mapping and point analysis.
To analyze insulating materials a deposition of a very thin conductive graphite or metal coatings can be deposited on the sample surface.
Contact Us
For further information, please contact:
Naida El Habra – naida.elhabra@cnr.it
FE-SEM FEI QUANTA 200 FEG ESEM
Padua
The Microscopy Lab at ICMATE-CNR of Padova is equipped with a Field Emission Scanning Electron Microscope (FESEM) FEI Quanta 200FEG-ESEM. Supplied with a field emission gun, it is capable to operate both in high and low vacuum conditions This versatility allows the direct investigation of a wide range of samples, including bulk materials, powders, coatings, and cross-sections, without requiring conductive coating in many cases.
Images are generated by using both Secondary Electrons (SE), to provide high resolution surface morphology, and Back-Scattered Electrons (BSE), to obtain compositional contrast based on elemental atomic number differences.
SEM analysis provides detailed information on:
- Sample morphology at micro- and nanoscale;
- Surface features, textures, and topography;
- Material contrast through electron-material interactions.
The instrument is also equipped for X-ray Spectrometry (EDS/EDX), which enables qualitative and semi-quantitative compositional analyses, elemental mapping, line scans, and point analysis. The combination of BSE imaging with EDX spectroscopy provides a powerful tool for correlating microstructure and chemical composition, allowing for a comprehensive characterization of complex materials.
To analyze insulating materials a deposition of a very thin conductive graphite or metal coatings can be deposited on the sample surface.
CONTACT
For further information, please contact Naida El Habra e-mail:naida.elhabra@cnr.it