LECCO FACILITIES
Overview
Keyence VHX-X1 digital microscope is an advanced instrument for optical observation, high-resolution image acquisition, and 2D/3D dimensional analysis of surfaces and microstructures. The configuration available at ICMATE includes the free-angle observation system VHX-S770E, a motorized XY stage, the fully integrated head VHX-7100, and the medium-magnification lens VHX-E100, providing high versatility for measurement and imaging across a wide range of materials and components.
The combination of a high-resolution sensor, multi-angle illumination, and integrated processing software enables rapid acquisition of sharp images with extended depth of field, three-dimensional surface reconstruction and analysis, and direct metrological quantification on acquired images (e.g., roughness measurements, profile and volume analysis). The instrument is ideal for the characterization of metallic, ceramic, and polymeric materials, microelectronic components, and surface coatings.
Keyence VHX-X1 digital microscope system.
Possible analysis
Examples of 3D reconstruction and surface analysis.
Metallographic observation with increased depth of field
Transmitted and reflected imaging
2D and 3D measurements
3D surface reconstruction
Profile and volume measurements
Roughness measurements (linear and/or surface roughness)
Digital microscope Keyence VHX-X1
Lecco unit
Keyence VHX-X1 digital microscope is an advanced instrument for optical observation, high-resolution image acquisition, and 2D/3D dimensional analysis of surfaces and microstructures. The configuration available at ICMATE includes the free-angle observation system VHX-S770E, a motorized XY stage, the fully integrated head VHX-7100, and the medium-magnification lens VHX-E100, providing high versatility for measurement and imaging across a wide range of materials and components.
The combination of a high-resolution sensor, multi-angle illumination, and integrated processing software enables rapid acquisition of sharp images with extended depth of field, three-dimensional surface reconstruction and analysis, and direct metrological quantification on acquired images (e.g., roughness measurements, profile and volume analysis). The instrument is ideal for the characterization of metallic, ceramic, and polymeric materials, microelectronic components, and surface coatings.
Possible analysis:
- Metallographic observation with increased deph of field
- Transmitted and reflected imaging
- 2D and 3D measurements
- 3D surface reconstruction
- Profile and volume measurements
- Roughness measurements ( linear and/or surface roughness)